Title :
VR noise analysis and reduction in printed circuit board designs
Author :
Yinglei Ren ; Wei Shen ; Kai Xiao
Author_Institution :
Intel Asia-Pacific R&D Ltd. Shanghai, Shanghai, China
Abstract :
Noise caused by switching voltage regulator (VR noise) can have a big impact on system signal / power performance, leading to signal integrity (SI) / power integrity (PI) issues. This paper introduces systematic ways of reducing VR noise as well as VR noise analysis methods. And a real design case with VR noise issue is shared with simulation and measurement results.
Keywords :
noise; printed circuits; voltage regulators; VR noise analysis methods; VR noise issue; VR noise reduction; power integrity; power performance; printed circuit board designs; signal integrity; switching voltage regulator; system signal; Couplings; Field effect transistors; Logic gates; Noise; Noise measurement; Receivers; Switches; defensive circuit; noise coupling; noise reduction; snubber circuit; voltage regulator noise;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6899000
