DocumentCode :
2368671
Title :
Worst-case crosstalk noise analysis based on dual-exponential noise metrics
Author :
Sun, Jiaxing ; Zheng, Yun ; Ye, Qing ; Ye, Tianchun
Author_Institution :
Dept. of IC Design, Chinese Acad. of Sci., Beijing, China
fYear :
2005
fDate :
3-7 Jan. 2005
Firstpage :
348
Lastpage :
353
Abstract :
Based on the assumption that crosstalk noise is dual-exponential waveform, in this paper we present the closed-form crosstalk noise metrics including the peak noise amplitude Vp, peak noise occurring time Tp and pulse width Wn. Then using part of our metrics we study aggressors switching times alignment that leads to worst-case crosstalk noise for a quiet victim from the analysis of peak noise window (PNW). The SPICE simulation results confirm the accuracy of our metrics and our analysis.
Keywords :
CMOS digital integrated circuits; SPICE; circuit simulation; crosstalk; integrated circuit design; integrated circuit noise; noise measurement; SPICE simulation; dual-exponential noise metrics; peak noise amplitude; peak noise occurring time; peak noise window; pulse width; worst-case crosstalk noise analysis; CMOS technology; Circuit noise; Crosstalk; Driver circuits; Equivalent circuits; Integrated circuit interconnections; Integrated circuit noise; Noise level; SPICE; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2005. 18th International Conference on
ISSN :
1063-9667
Print_ISBN :
0-7695-2264-5
Type :
conf
DOI :
10.1109/ICVD.2005.173
Filename :
1383300
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2368671
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