Title :
Equivalence checking using independent cuts [logic design verification]
Author :
Xu, Zhan ; Yan, Xiaolang ; Lu, Yongjiang ; Ge, Haitong
Author_Institution :
Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China
Abstract :
With the increase in the complexity of present day systems, proving the correctness of a design has become a major concern. This paper describes a novel implementation of a BDD-based combinational equivalence checking (CEC) tool, which is distinguished from others by one heuristic. It is proposed to select an effective cut, with no dependence remaining. In addition, successfully verification of all the ISCAS´85 benchmark circuits demonstrates the efficiency of our approach.
Keywords :
binary decision diagrams; formal verification; heuristic programming; logic design; logic testing; BDD CEC tool; combinational equivalence checking tool; equivalence checking independent cuts; heuristics; logic design verification; Automatic test pattern generation; Binary decision diagrams; Boolean functions; Circuit simulation; Combinational circuits; Data structures; Engines; Explosions; Logic circuit testing; Logic design; Very large scale integration;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250864