Title :
Characterizing the transient device behavior of SCRs by means of VFTLP waveform analysis
Author :
Wybo, Geert ; Verleye, Stefaan ; Van Camp, Benjamin ; Marichal, Olivier
Author_Institution :
Sarnoff Europe, Gistel
Abstract :
New insights regarding the interpretation of the VFTLP IV-curve and the fast transient current and voltage waveform data are presented. These insights are used to determine the design factors affecting the turn-on time and triggering behavior of SCRs in a 90 nm bulk CMOS technology.
Keywords :
CMOS integrated circuits; thyristors; CMOS technology; SCR; VFTLP waveform analysis; transient device behavior; CMOS technology; Electronics industry; Europe; Protection; Pulse measurements; Stress; Thyristors; Time measurement; Transient analysis; Voltage;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401775
