DocumentCode
2368738
Title
The Reliability of Semiconductor Devices: An Overview
Author
Bazu, Marius
Author_Institution
National Institute for Research and Development in Microtechnologies
Volume
3
fYear
1998
fDate
14-15 May 1998
Firstpage
785
Lastpage
788
Keywords
Concurrent engineering; Cultural differences; Defense industry; Humans; Input variables; Manufacturing processes; Quality management; Semiconductor device reliability; Semiconductor devices; Total quality management;
fLanguage
English
Publisher
ieee
Conference_Titel
Optimization of Electrical and Electronic Equipments, 1998. OPTIM '98. Proceedings of the 6th International Conference on
Conference_Location
Brasov, Romania
Print_ISBN
973-98511-2-6
Type
conf
DOI
10.1109/OPTIM.1998.708047
Filename
708047
Link To Document