DocumentCode :
2368738
Title :
The Reliability of Semiconductor Devices: An Overview
Author :
Bazu, Marius
Author_Institution :
National Institute for Research and Development in Microtechnologies
Volume :
3
fYear :
1998
fDate :
14-15 May 1998
Firstpage :
785
Lastpage :
788
Keywords :
Concurrent engineering; Cultural differences; Defense industry; Humans; Input variables; Manufacturing processes; Quality management; Semiconductor device reliability; Semiconductor devices; Total quality management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optimization of Electrical and Electronic Equipments, 1998. OPTIM '98. Proceedings of the 6th International Conference on
Conference_Location :
Brasov, Romania
Print_ISBN :
973-98511-2-6
Type :
conf
DOI :
10.1109/OPTIM.1998.708047
Filename :
708047
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2368738
بازگشت