Title :
Influence of leakage reduction techniques on delay/leakage uncertainty
Author :
Tsai, Yuh-Fang ; Vijaykrishnan, N. ; Xie, Yuan ; Irwin, Mary Jane
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
One of the main challenges for design in the presence of process variations is to cope with the uncertainties in delay and leakage power. In this paper, the influence of leakage reduction techniques on delay/leakage uncertainty is examined through Monte-Carlo analysis. The techniques investigated in this paper include increasing gate length, stack forcing, body biasing, and Vdd/Vth optimization. The impact of technology scaling and temperature sensitivity on the uncertainty reduction are also evaluated. We investigate the uncertainty-power-delay trade-off and suggest techniques for designs targeting different requirements.
Keywords :
Monte Carlo methods; circuit optimisation; delays; integrated circuit design; leakage currents; low-power electronics; Monte Carlo analysis; body biasing; delay/leakage uncertainty; gate length; integrated circuit design; leakage power; leakage reduction; stack forcing; uncertainty-power-delay trade-off; Computer science; Delay; Design engineering; Energy consumption; Frequency; Leakage current; Power engineering and energy; Threshold voltage; Transistors; Uncertainty;
Conference_Titel :
VLSI Design, 2005. 18th International Conference on
Print_ISBN :
0-7695-2264-5
DOI :
10.1109/ICVD.2005.111