DocumentCode :
2368762
Title :
Cost-efficient fabrication of UV/Vis nanowire (NW) photodiodes enabled by ZnO/Si radial heterojunction
Author :
Um, Han-Don ; Park, Kwang-Tae ; Jung, Jin-Young ; Jee, Sang-Won ; Abdul Moiz, Syed ; Ahn, Cheol Hyoun ; Cho, Hyung Koun ; Lee, Eunsongyi ; Kim, Dong-Wook ; Park, Yun Chang ; Yang, Jun Mo ; Lim, Sung Kyu ; Lee, Jung-Ho
Author_Institution :
Dept. of Bio-Nano Technol., Hanyang Univ., Ansan, South Korea
fYear :
2010
fDate :
6-8 Dec. 2010
Abstract :
Radial heterojunction nanowires (NWs) using a ZnO(shell)/Si(core) coaxial structure are for the first time reported for a novel photodiode application. Strong antireflective characteristics are shown by employing vertically aligned Si NW arrays. A thin ZnO shell deposited onto a Si NW formed a radial junction which enabled effective separation of charge carriers. Furthermore, a ZnO nanostructure demonstrates a very high internal gain in photoconductivity due to the surface-enhanced electron-hole separation. The photodetection range, either ultraviolet (UV) or visible, can be determined by applying forward or reverse bias, respectively. Compared to a planar heterojunction photodiode, a photoresponsivity of the radial heterojunction structure shows similar values despite only ~20% consumption of a ZnO thickness required for a planar junction. In addition, ~2.5 times increase in UV responsivity is also presented using the radial heterojunction structure under the ZnO thickness same as a planar counterpart. Our coaxial ZnO/Si NW photodetectors suggest bright prospect for enhancing a photoresponsivity while less consuming ZnO via controlling the wired nanostructure.
Keywords :
nanowires; photoconductivity; photodiodes; zinc compounds; ZnO-Si; charge carriers; cost efficient fabrication; nanowire; photoconductivity; photodiode application; planar heterojunction photodiode; radial heterojunction; surface-enhanced electron-hole separation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4424-7418-5
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2010.5703330
Filename :
5703330
Link To Document :
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