Title :
A new versatile high speed pattern generator for nanolithography
Author :
Wei, Shuhua ; Liu, Wei ; Li Ham
Author_Institution :
Inst. of Electr. Eng., Chinese Acad. of Sci., Beijing
Abstract :
A new versatile high speed pattern generator for nanolevel structure research and applications has been designed and developed. The digital signal processor (DSP) is employed in the pattern generator, so coordinates of exposure points inside. the primitive shapes can be calculated with a very high speed. The beam scanning of scanning electron microscope (SEM) is controlled by two sets of 16 bit digital-to-analog converters (DACs). Meanwhile the hardware can acquire SEM images, transfer data and control laser stage. Users can design various patterns and import common industrial layouts such as CIF/GDSII format files by the software package. The powerful display, drawing, and editing capabilities of the software package can accomplish different user necessities for pattern design. The experiments indicate the resolution can approach nanometer, and the field stitching accuracy better than 0.2 mum.
Keywords :
digital signal processing chips; digital-analogue conversion; electron beam lithography; nanoelectronics; nanolithography; scanning electron microscopy; 16 bit digital-to-analog converters; SEM images; beam scanning technique; digital signal processor; electron beam lithography; field stitching accuracy; high speed pattern generator; nanofabrication; nanolevel structure research; nanolithography; scanning electron microscope; software package; Digital signal processing; Digital signal processors; Electron beams; Laser beams; Nanolithography; Nanostructures; Scanning electron microscopy; Shape; Signal generators; Software packages; Electron beam lithography; Nanofabrication; Nanolithography; Pattern design; Pattern generator;
Conference_Titel :
Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1572-4
Electronic_ISBN :
978-1-4244-1573-1
DOI :
10.1109/INEC.2008.4585610