Error detection and correction in VLSI systems by online testing and retrying

Author

Jiang, Jian-Hui

Author_Institution

Dept. of Comput. Sci. & Technol., Tongii Univ., Shanghai, China

fYear

2003

fDate

16-19 Nov. 2003

Firstpage

504

Abstract

The conventional dual-module redundant (DMR) structure with comparison is a kind of self-testing structure used in some commercial general-purpose computers, such as IBM 4341 processor and IBM S/390 G3 and G4. One of its drawbacks is it does not have error recovery ability. Retrying finds applications because of its low hardware overhead. Micro-rollback and instruction retry as in VAX 8600 are effective methods for rapid error recovery that the error detection latency is only a few clock cycles.

Keywords

VLSI; built-in self test; error correction; error detection; fault simulation; hardware description languages; integrated circuit design; integrated circuit testing; Active-VHDL; VLSI systems; complementary logic switching; error correction; error detection; intermittent faults; online retrying; online testing; self-checking design; self-testing structure; transient faults; Application software; Circuit faults; Circuit testing; Computer errors; Computer science; Error analysis; Error correction; Fault tolerance; Hardware design languages; Integrated circuit design; Integrated circuit testing; Logic; Self-testing; System testing; Very large scale integration; Very-large-scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2003. ATS 2003. 12th Asian

ISSN

1081-7735

Print_ISBN

0-7695-1951-2

Type

conf

DOI

10.1109/ATS.2003.1250873

Filename

1250873