• DocumentCode
    236882
  • Title

    A new tail-fit method design for jitter decomposition

  • Author

    Chunchun Sui ; Beetner, Daryl G. ; Ting Zhu ; Cheng, C.-C.

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2014
  • fDate
    4-8 Aug. 2014
  • Firstpage
    423
  • Lastpage
    427
  • Abstract
    Although decreasing IC feature size and increasing I/O speed enable better system capability and performance, they also introduce technological challenges. One of the most important challenges is as I/O speed increases: jitter should decrease accordingly to ensure a reasonable bit error rate (BER) for a link system. Precise jitter characterization of signals at critical internal nodes provides valuable information for hardware fault diagnosis and next generation design. Understanding the separate contributions to jitter is challenging in this high speed industrial world. In this paper, Bounded Uncorrelated Jitter (BUJ), Random Jitter (RJ) and Periodic Jitter (PJ) are examined. A method is proposed to find BUJ in the presence of RJ, by first estimating RJ and then finding BUJ through de-convolution. A new tail-fit method is proposed to estimate the probability distribution for RJ. This new tail fit method is applicable for the general signal histogram, while the traditional tail fit method is only valid for the specific or ideal signal histogram.
  • Keywords
    deconvolution; digital signal processing chips; error statistics; fault diagnosis; integrated circuit design; jitter; statistical distributions; BER; BUJ; I-O speed; IC feature size; PJ; RJ; bit error rate; bounded uncorrelated jitter; deconvolution; hardware fault diagnosis; jitter characterization; jitter decomposition; link system; next generation design; periodic jitter; probability distribution; random jitter; signal histogram; tail-fit method design; Clocks; Crosstalk; Gaussian distribution; Histograms; Jitter; Noise; Probability density function; Bounded Uncorrelated Jitter; de-convolution; jitter decomposition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
  • Conference_Location
    Raleigh, NC
  • Print_ISBN
    978-1-4799-5544-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2014.6899009
  • Filename
    6899009