DocumentCode :
2368879
Title :
Direct Determination Of The Electron Mobility In Photorefractive BiI2SiO/sub 20/ By A Holographic Technique
Author :
Partanen, J.P. ; Jonathan, J.M.C. ; Hellwarth, R.W.
Author_Institution :
University of Southern California
fYear :
1990
fDate :
16-20 July 1990
Firstpage :
261
Lastpage :
262
Keywords :
Crystals; Current measurement; Electric variables measurement; Electron mobility; Holography; Photoconductivity; Photorefractive materials; Physics; Refractive index; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nonlinear Optics: Materials, Phenomena and Devices, 1990. Digest. NLO '90.
Conference_Location :
Kauai, HI, USA
Type :
conf
DOI :
10.1109/NLO.1990.695944
Filename :
695944
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2368879
بازگشت