• DocumentCode
    2368879
  • Title

    Direct Determination Of The Electron Mobility In Photorefractive BiI2SiO/sub 20/ By A Holographic Technique

  • Author

    Partanen, J.P. ; Jonathan, J.M.C. ; Hellwarth, R.W.

  • Author_Institution
    University of Southern California
  • fYear
    1990
  • fDate
    16-20 July 1990
  • Firstpage
    261
  • Lastpage
    262
  • Keywords
    Crystals; Current measurement; Electric variables measurement; Electron mobility; Holography; Photoconductivity; Photorefractive materials; Physics; Refractive index; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nonlinear Optics: Materials, Phenomena and Devices, 1990. Digest. NLO '90.
  • Conference_Location
    Kauai, HI, USA
  • Type

    conf

  • DOI
    10.1109/NLO.1990.695944
  • Filename
    695944