Title :
Simple D flip-flop behavioral model of ESD immunity for use in the ISO 10605 standard
Author :
Guangyao Shen ; Khilkevich, Victor ; Sen Yang ; Pommerenke, David ; Aichele, Hermann ; Eichel, Dirk ; Keller, Chris
Author_Institution :
Missouri S&T EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
As the ESD stress is becoming more and more important for integrated circuits (ICs), the ability to predict IC failures becomes critical. In this paper, an 18 MHz D flip-flop IC is characterized and its behavioral model is presented. The resulting IC model is validated in the setup according to the ISO 10605 standard. A complete model of the setup combining the IC behavioral model and the passive parts of the setup is built to estimate the failure prediction accuracy in a totally simulated environment. The results show that the model can predict the triggering level with the error of less than 20%.
Keywords :
ISO standards; electrostatic discharge; failure analysis; flip-flops; integrated circuit modelling; integrated circuit testing; D flip-flop IC; D flip-flop behavioral model; ESD immunity; ESD stress; IC behavioral model; IC failures; ISO 10605 standard; electrostatic discharge; failure prediction accuracy; frequency 18 MHz; integrated circuits; Clocks; Electrostatic discharges; ISO standards; Integrated circuit modeling; Predictive models; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6899015
