Title :
Third IEEE International Conference on Data Mining
Abstract :
The following topics are dealt with: data mining; pattern clustering; statistical analysis; pattern classification; machine learning; Bayesian network; very large databases; relational databases; pattern matching; association rules; knowledge discovery.
Keywords :
data mining; database management systems; learning (artificial intelligence); pattern recognition; statistical analysis; association rules; data mining; knowledge discovery; machine learning; pattern classification; pattern clustering; pattern matching; relational databases; statistical analysis; very large databases; Database management systems; Learning systems; Pattern recognition; Statistics;
Conference_Titel :
Data Mining, 2003. ICDM 2003. Third IEEE International Conference on
Conference_Location :
Melbourne, FL, USA
Print_ISBN :
0-7695-1978-4
DOI :
10.1109/ICDM.2003.1250888