Title :
Predict the Reliability of Complex Systems by Applying the Monte Carlo Method
Author :
Bajenescu, Titu I.
Keywords :
Availability; Costs; Electronic equipment; Event detection; Fault trees; Frequency; Monte Carlo methods; Sensitivity analysis; Statistical distributions; System testing;
Conference_Titel :
Optimization of Electrical and Electronic Equipments, 1998. OPTIM '98. Proceedings of the 6th International Conference on
Conference_Location :
Brasov, Romania
Print_ISBN :
973-98511-2-6
DOI :
10.1109/OPTIM.1998.708048
