• DocumentCode
    2369052
  • Title

    650V SOI LIGBT for Switch-Mode Power Supply Application

  • Author

    Letavic, T. ; Petruzzello, J. ; Claes, J. ; Eggenkamp, P. ; Janssen, E. ; van der Wal, A.

  • Author_Institution
    Philips Res. North America, Briarcliff Manor, NY
  • fYear
    2006
  • fDate
    4-8 June 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a thin-layer high voltage silicon-on-insulator conductivity modulated device which has been optimized for use within integrated switch mode power supply applications. The device contains a linearly-graded charge profile in the drift region, and the fast-switching LIGBT can be used at current densities which are at least a factor-of-two greater than the SOI LDMOS of equivalent breakdown voltage (LIGBT BVds 650V/Rsp 4 ohm mm2). A device failure mechanism which occurs during shorted-winding SMPS transients unique to thin-layer devices has been documented, and device protection circuitry has been developed to provide a transient current limit mechanism within the high voltage device. The electrical characteristics of the protected conductivity modulated thin-layer SOI high voltage device are comparable to state-of-the-art discrete components, and as such this process technology provides a monolithic alternative for miniaturization and integration of switch mode power supply topologies
  • Keywords
    current density; insulated gate bipolar transistors; semiconductor device breakdown; silicon-on-insulator; switched mode power supplies; 650 V; SOI LIGBT; breakdown voltage; device protection circuitry; discrete components; integrated switch mode power supply; silicon-on-insulator; transient current limit mechanism; Circuits; Conductivity; Current density; Failure analysis; Power supplies; Protection; Silicon on insulator technology; Switched-mode power supply; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on
  • Conference_Location
    Naples
  • Print_ISBN
    0-7803-9714-2
  • Type

    conf

  • DOI
    10.1109/ISPSD.2006.1666145
  • Filename
    1666145