Title :
On the optimization of the return current paths of signal vias in high-speed interposers and PCBs using the M3-approach
Author :
Ndip, Ivan ; Lobbicke, Kai ; Tschoban, Christian ; Ranzinger, Christian ; Richlowski, Karim ; Contag, Andreas ; Reichl, Herbert ; Lang, K.-D. ; Henke, Heino
Author_Institution :
Fraunhofer IZM, Berlin, Germany
Abstract :
In this paper, the return-current paths of signal vias transiting multilayered stack-ups are optimized using the M3-approach (methodologies, models, measures). A methodology for suppressing the excitation of parallel-plate modes in these stack-ups is first proposed. The result of this methodology is a stack-up with well-defined paths for the returning conduction currents. Secondly, a model of the stack-up is developed and experimentally verified using measurement results. The model is then applied to study the impact of the impedance of the return-current paths on the effectiveness of the proposed stack-up in suppressing the excitation of cavity resonance modes. Based on the results of this study, appropriate designs measures for optimizing the return-current paths of the signal vias are derived. To demonstrate the advantages of these measures, they are applied to fabricate a new test board with the proposed stack-up. The measurement results show excellent signal transmission and no dips in the insertion loss of the signal via for frequencies up to 20 GHz.
Keywords :
electromagnetic interference; interference suppression; optimisation; printed circuits; signal processing; M3-approach; PCB; cavity resonance modes; electromagnetic interference; excitation suppression; high-speed interposers; insertion loss; methodologies-models-measures approach; multilayered stack-up transition; parallel-plate modes; power integrity; printed circuit boards; return current path optimization; signal integrity; signal transmission; signal vias; Capacitors; Cavity resonators; Electromagnetic interference; Impedance; Insertion loss; Loss measurement; Transmission line measurements;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6899022