Impact of clock net routing on EMC emissions performance of automotive electronic modules

Author

Filipov, S. ; Hadzhikrasteva, A. ; Nandyala, C. ; Mee, S. ; Russa, K. ; Lutz, A.

Author_Institution

Automotive Electron., Johnson Controls, Sofia, Bulgaria

fYear

2014

fDate

4-8 Aug. 2014

Firstpage

513

Lastpage

518

Abstract

Modern automotive electronic products with highspeed digital interfaces pose design challenges in the areas of signal integrity (SI) and electromagnetic compatibility (EMC). On one hand, the manufacturer must comply with legal and industry specific EMC requirements and on the other hand, the product is expected to function seamlessly over all environmental conditions and process tolerances. Numerous guidelines have been published on how to optimize the design performance in these two areas (EMC & SI) but few address the impact one can have on the other. This paper examines the impact several SI compliant routing patterns have on EMC emissions performance.

Keywords

automotive electronics; electromagnetic compatibility; EMC emissions performance; SI compliant routing patterns; automotive electronic modules; automotive electronic products; clock net routing; electromagnetic compatibility; environmental conditions; high-speed digital interfaces; process tolerances; signal integrity; Clocks; Electromagnetic compatibility; Impedance; Microstrip; Routing; Silicon; Topology; EMC; clock traces; emissions; high-speed digital interface; rise-time; routing; signal integrity;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on

Conference_Location

Raleigh, NC

Print_ISBN

978-1-4799-5544-2

Type

conf

DOI

10.1109/ISEMC.2014.6899026

Filename

6899026