• DocumentCode
    2369426
  • Title

    A wide-swing VT-referenced circuit with insensitivity to device mismatch

  • Author

    Yen, Chih-Jen ; Chung, Wen-Yaw ; Chi, Mely Chen

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    539
  • Lastpage
    542
  • Abstract
    This study presents a wide-swing VT referenced circuit which is insensitive to device mismatch in CMOS technology. The wide-swing cascode design is used to increase the output resistance, maximize the voltage-signal swings, and improve the current matching. The error current is greatly reduced by providing an additional mirrored current in the VT-referenced circuit. A start-up circuitry is also included, which affects only the circuit in the case that all currents in the loop are zero. All the bipolar-junction transistors are laid out using the p-substrate PNP structure. Analytic results indicate that the proposed circuit is insensitive to device mismatch, and provides a stable bias current accurately.
  • Keywords
    CMOS analogue integrated circuits; bipolar transistors; reference circuits; CMOS technology; PNP structure; bias current; bipolar-junction transistors; current matching; device mismatch; error current; p-substrate; voltage-signal swings; wide-swing VT referenced circuit; wide-swing cascode design; Analog circuits; CMOS process; CMOS technology; Character generation; MOSFETs; Manufacturing processes; Operational amplifiers; Power amplifiers; Signal design; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2005. 18th International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-2264-5
  • Type

    conf

  • DOI
    10.1109/ICVD.2005.39
  • Filename
    1383331