Broadband Microwave and W-Band Characterization of BeO-SiC and AIN-Based Lossy Dielectric Composites for Vacuum Electronics

Author

Calame, J.P. ; Garven, M. ; Lobas, D. ; Myers, R.E. ; Wood, F. ; Abe, D.K.

Author_Institution

Naval Res. Lab.

fYear

0

fDate

0-0 0

Firstpage

37

Lastpage

38

Abstract

The complex dielectric permittivity properties of lossy ceramic materials used in vacuum electronics are presented. The studies include broadband room temperature behavior in the 0.1-18 GHz range and in W-Band (75-110 GHz). Variable temperature measurements of selected materials at 94 GHz are also presented

Keywords

aluminium compounds; beryllium compounds; ceramics; dielectric properties; microwave measurement; silicon compounds; temperature measurement; vacuum microelectronics; wide band gap semiconductors; 0.1 to 18 GHz; 75 to 110 GHz; AlN; AlN-based lossy dielectric composites; BeO-SiC; W-band characterization; broadband microwave characterization; dielectric permittivity; lossy ceramic materials; vacuum electronics; Ceramics; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency; Permittivity measurement; Silicon carbide; Temperature distribution; Temperature measurement; ceramics; dielectrics; instabilities;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference, 2006 held Jointly with 2006 IEEE International Vacuum Electron Sources., IEEE International

Conference_Location

Monterey, CA

Print_ISBN

1-4244-0108-9

Type

conf

DOI

10.1109/IVELEC.2006.1666172

Filename

1666172