DocumentCode :
236953
Title :
Far-field radiation estimation from near-field measurements and image theory
Author :
Jingnan Pan ; Xu Gao ; Yaojiang Zhang ; Jun Fan
Author_Institution :
EMC Laboratroy, Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear :
2014
fDate :
4-8 Aug. 2014
Firstpage :
609
Lastpage :
614
Abstract :
This paper proposed a near-field to far-field transformation method for the radiation sources located on a large ground plane, based on the Huygens´s principle and image theory. This method uses the tangential electromagnetic fields on a small near-field plane and the vertical electric fields, one tangential component (parallel to the ground plane) of magnetic fields around the near-field plane to extract the equivalent current sources. The far-field radiations are calculated from these equivalent sources and their images. The application of this method in several simulation models indicates that it has very good performance on both simple printed circuit boards and antenna radiation estimation. The method proposed in this paper can decrease the total scanning area in real measurements.
Keywords :
antenna radiation patterns; constant current sources; electromagnetic fields; electromagnetic wave propagation; Huygens´s principle; antenna radiation estimation; equivalent current sources; far-field radiations; image theory; large ground plane; near-field plane; near-field to far-field transformation method; printed circuit boards; radiation sources; tangential electromagnetic fields; total scanning area; vertical electric fields; Accuracy; Antenna measurements; Current measurement; Electromagnetic fields; Estimation; Magnetic field measurement; Mathematical model; Huygens´s principle; image theory; near-field to far-field transformation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
Type :
conf
DOI :
10.1109/ISEMC.2014.6899043
Filename :
6899043
Link To Document :
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