Title :
138dB-dynamic-range CMOS image sensor with new pixel architecture
Author :
Stoppa, D. ; Simoni, A. ; Gonzo, L. ; Gottardi, M. ; Dalla Betta, G.-F.
Author_Institution :
ITC/IRST
Keywords :
CMOS image sensors; CMOS technology; Circuit noise; Circuit testing; Dynamic range; Image sensors; Lighting; Signal resolution; Smart pixels; Threshold voltage;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992091
