DocumentCode
2369906
Title
Local structural properties and growth mechanism of ZnO nanostrcutures
Author
Jeong, Eon-Seok ; Han, Sang-Wook ; Vayssieres, L.
Author_Institution
Div. of Sci. Educ., Chonbuk Nat. Univ., Jeonju
fYear
2008
fDate
24-27 March 2008
Firstpage
1099
Lastpage
1101
Abstract
We investigated the growth mechanism of ZnO nanorods using in-situ extended X-ray absorption fine structure (EXAFS). ZnO nanorods were synthesized with a solution method and the structural properties around zinc atoms were measured by the in-situ EXAFS at every process. The synthesis was started with the solution of ZnNO3 powder and H2O. The solution was added with an amino acid complex and then heated up to 80degC. The EXAFS revealed that the zinc atoms of the solution had only two oxygen atoms without any second neighboring atoms, implying that ZnNO3 is amorphous. When the complex was applied to the solution, the second neighboring Zn atoms appeared, although there was a substantial amount of structural disorders existing in the Zn-Zn pairs. This result suggests that the nitrogen ions in the complex play a role in clustering ZnO. At 80degC, ZnO was rapidly crystallized and the structural disorders disappeared. The in-situ EXAFS measurements provided the critical information of ZnO crystallization in the solution.
Keywords
EXAFS; II-VI semiconductors; crystallisation; nanostructured materials; nanotechnology; semiconductor growth; wide band gap semiconductors; zinc compounds; EXAFS; X-ray absorption fine structure; ZnO; amino acid complex; crystallization; nanorods; nanostructure growth; powder; solution method; structural properties; temperature 80 C; Mechanical factors; Nanoelectronics; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
Conference_Location
Shanghai
Print_ISBN
978-1-4244-1572-4
Electronic_ISBN
978-1-4244-1573-1
Type
conf
DOI
10.1109/INEC.2008.4585674
Filename
4585674
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