Title :
A 45GHz SiGe active frequency multiplier
Author :
Hackl, S. ; Bock, J. ; Ritzberger, G. ; Wurzer, M. ; Knapp, H. ; Treitinger, L. ; Scholtz, A.L.
Author_Institution :
Infineon Technologies AG, Technical University of Vienna
Keywords :
Broadband communication; Circuit testing; Delay; Frequency measurement; Gain measurement; Germanium silicon alloys; Lithography; Power measurement; Silicon germanium; Size measurement;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992110