• DocumentCode
    2370070
  • Title

    A Study of Macroscopic Emission Non-Uniformity in Thermionic Cathodes Due to Profilimetry Variation

  • Author

    Jensen, Kevin L. ; Lau, Y.Y. ; Jordan, Nicholas

  • Author_Institution
    Electron. Sci. & Technol. Div., Naval Res. Lab.
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    101
  • Lastpage
    102
  • Abstract
    We develop a model to show that the micron-scale ridges due to surface machining of thermionic dispenser cathodes may cause significant angular variations in the macroscopic current density on ring-shaped cathodes as are commonly used in gyrotrons. The local field enhancement caused by the ridges resulting from machining gives an angular variation in current that may be pronounced. An explanation in terms of wobble of the cathode during machining and the eccentricity of the cathode cross-section can explain much of the observed variation
  • Keywords
    gyrotrons; thermionic cathodes; thermionic emission; cathode wobble; dispenser cathode; field-enhanced thermionic emission; gyrotrons; local field enhancement; macroscopic current density variation; macroscopic emission nonuniformity; micron-scale ridges; profilometry variation; ring-shaped cathodes; surface machining; thermionic cathodes; thermionic dispenser cathodes; Cathodes; Current density; Electromagnetic heating; Fourier transforms; Gyrotrons; Laboratories; Machining; Microscopy; Temperature; Thermionic emission; dispenser cathode; emission non-uniformity; field-enhanced thermionic emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2006 held Jointly with 2006 IEEE International Vacuum Electron Sources., IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    1-4244-0108-9
  • Type

    conf

  • DOI
    10.1109/IVELEC.2006.1666204
  • Filename
    1666204