DocumentCode
2370452
Title
Modeling the switching dynamics of programmable-metallization-cell (PMC) memory and its application as synapse device for a neuromorphic computation system
Author
Yu, Shimeng ; Wong, H. S Philip
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear
2010
fDate
6-8 Dec. 2010
Abstract
A physical model is developed to investigate the switching dynamics of programmable-metallization-cell (PMC) memory. Both “quasi-DC” and time-dependent transient characteristics of PMC are captured by this model in good agreement with the experimental data from Cu/SiO2 and Ag/Ge0.3Se0.7 cells. For the first time, the time-dependent switching process of PMC is quantified, thus paving the way for a compact SPICE model for circuit simulation. This model reveals that experimentally measured switching parameters such as threshold voltage and cell resistance are dynamic quantities that depend on the programming pulse shape and not the pulse amplitude alone. Using this model, we show that the PMC has the potential to emulate the function of a biological synapse and exhibit the spike-timing-dependent plasticity (STDP) behavior for emerging neuromorphic computation system designs.
Keywords
SPICE; circuit simulation; integrated circuit metallisation; neural chips; random-access storage; transient analysis; PMC emory; PMC memory; STDP behavior; biological synapse; cell resistance; circuit simulation; compact SPICE model; neuromorphic computation system designs; physical model; programmable-metallization-cell memory; programming pulse shape; pulse amplitude; quasi-DC transient characteristics; spike-timing-dependent plasticity behavior; switching dynamics; switching parameters; synapse device; threshold voltage; time-dependent switching process; time-dependent transient characteristics;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location
San Francisco, CA
ISSN
0163-1918
Print_ISBN
978-1-4424-7418-5
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2010.5703410
Filename
5703410
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