• DocumentCode
    2370452
  • Title

    Modeling the switching dynamics of programmable-metallization-cell (PMC) memory and its application as synapse device for a neuromorphic computation system

  • Author

    Yu, Shimeng ; Wong, H. S Philip

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2010
  • fDate
    6-8 Dec. 2010
  • Abstract
    A physical model is developed to investigate the switching dynamics of programmable-metallization-cell (PMC) memory. Both “quasi-DC” and time-dependent transient characteristics of PMC are captured by this model in good agreement with the experimental data from Cu/SiO2 and Ag/Ge0.3Se0.7 cells. For the first time, the time-dependent switching process of PMC is quantified, thus paving the way for a compact SPICE model for circuit simulation. This model reveals that experimentally measured switching parameters such as threshold voltage and cell resistance are dynamic quantities that depend on the programming pulse shape and not the pulse amplitude alone. Using this model, we show that the PMC has the potential to emulate the function of a biological synapse and exhibit the spike-timing-dependent plasticity (STDP) behavior for emerging neuromorphic computation system designs.
  • Keywords
    SPICE; circuit simulation; integrated circuit metallisation; neural chips; random-access storage; transient analysis; PMC emory; PMC memory; STDP behavior; biological synapse; cell resistance; circuit simulation; compact SPICE model; neuromorphic computation system designs; physical model; programmable-metallization-cell memory; programming pulse shape; pulse amplitude; quasi-DC transient characteristics; spike-timing-dependent plasticity behavior; switching dynamics; switching parameters; synapse device; threshold voltage; time-dependent switching process; time-dependent transient characteristics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2010 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4424-7418-5
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2010.5703410
  • Filename
    5703410