Title :
A 4GSample/s 8b ADC in 0.35/spl mu/m CMOS
Author :
Poulton, K. ; Neff, R. ; Muto, A. ; Liu, Wenxin ; Burstein, A. ; Heshami, M.
Author_Institution :
Agilent Technologies
Keywords :
Bandwidth; Calibration; Circuit noise; Clocks; Delay; Jitter; Noise reduction; Pipelines; Signal resolution; Timing;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992176
