DocumentCode
2370489
Title
The first principle computer simulation and real device characteristics of superlattice phase-change memory
Author
Tominaga, J. ; Simpson, R. ; Fons, P. ; Kolobov, A.
Author_Institution
Nanodevice Innovation Res. Center, Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear
2010
fDate
6-8 Dec. 2010
Abstract
This paper presents of atomically controlled Ge-Sb-Te films that enable a suppression of switching energy, and an increase in speed faster than that using the composite films in Set and Reset. The first principle computer simulations using NVT ensemble dynamics and real device fabrication based on the model were carried out. We found that the obtained experimental data are in good agreement with the simulation models, and succeeded in suppressing the Reset energy by less than 10%.
Keywords
antimony; circuit simulation; elemental semiconductors; germanium; phase change memories; semiconductor thin films; tellurium; Ge-Sb-Te; NVT ensemble dynamics; Reset energy; Set energy; composite films; computer simulation model; real device fabrication; superlattice phase-change memory; switching energy suppression;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location
San Francisco, CA
ISSN
0163-1918
Print_ISBN
978-1-4424-7418-5
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2010.5703412
Filename
5703412
Link To Document