DocumentCode :
2370489
Title :
The first principle computer simulation and real device characteristics of superlattice phase-change memory
Author :
Tominaga, J. ; Simpson, R. ; Fons, P. ; Kolobov, A.
Author_Institution :
Nanodevice Innovation Res. Center, Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear :
2010
fDate :
6-8 Dec. 2010
Abstract :
This paper presents of atomically controlled Ge-Sb-Te films that enable a suppression of switching energy, and an increase in speed faster than that using the composite films in Set and Reset. The first principle computer simulations using NVT ensemble dynamics and real device fabrication based on the model were carried out. We found that the obtained experimental data are in good agreement with the simulation models, and succeeded in suppressing the Reset energy by less than 10%.
Keywords :
antimony; circuit simulation; elemental semiconductors; germanium; phase change memories; semiconductor thin films; tellurium; Ge-Sb-Te; NVT ensemble dynamics; Reset energy; Set energy; composite films; computer simulation model; real device fabrication; superlattice phase-change memory; switching energy suppression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4424-7418-5
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2010.5703412
Filename :
5703412
Link To Document :
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