• DocumentCode
    2370489
  • Title

    The first principle computer simulation and real device characteristics of superlattice phase-change memory

  • Author

    Tominaga, J. ; Simpson, R. ; Fons, P. ; Kolobov, A.

  • Author_Institution
    Nanodevice Innovation Res. Center, Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
  • fYear
    2010
  • fDate
    6-8 Dec. 2010
  • Abstract
    This paper presents of atomically controlled Ge-Sb-Te films that enable a suppression of switching energy, and an increase in speed faster than that using the composite films in Set and Reset. The first principle computer simulations using NVT ensemble dynamics and real device fabrication based on the model were carried out. We found that the obtained experimental data are in good agreement with the simulation models, and succeeded in suppressing the Reset energy by less than 10%.
  • Keywords
    antimony; circuit simulation; elemental semiconductors; germanium; phase change memories; semiconductor thin films; tellurium; Ge-Sb-Te; NVT ensemble dynamics; Reset energy; Set energy; composite films; computer simulation model; real device fabrication; superlattice phase-change memory; switching energy suppression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2010 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4424-7418-5
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2010.5703412
  • Filename
    5703412