• DocumentCode
    2370500
  • Title

    High power and linearity CMOS RFIC transmit-receive switch for ultra-Wideband radar and communication systems

  • Author

    Jin, Yalin ; Nguyen, Cam

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX
  • fYear
    2008
  • fDate
    21-23 May 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We report on the development of an ultrawideband fully-integrated T/R switch, fabricated on a commercial standard 0.18-mum CMOS process, with unprecedented performance. It occupies a very small die area of 230 mum times 250 mum. The new T/R switch employs an ultrabroadband topology based on the synthetic transmission-line concept with on-chip spiral inductors. Simultaneously floating and applying negative bias to the bulk or positive bias to the drain are implemented to enhance the linearity and power handling of the switch. The developed CMOS T/R switch exhibits an insertion loss lower than 1 dB from DC to 18 GHz and less than 2.5 dB up to 20 GHz. The measured isolation is between 32-60 dB, 25-32 dB, and 25-27 dB and P1dB varies between 25.4-26.2 dBm, 22.6-25.4 dBm, and 19.8-22.6 dBm from DC-10 GHz, 10-18 GHz, and 18-20 GHz, respectively. The measured input third-order intercept point (IIP3) reaches as high as 41 dBm.
  • Keywords
    CMOS integrated circuits; MMIC; inductors; microwave switches; radar equipment; ultra wideband radar; frequency 10 GHz to 18 GHz; input third-order intercept point; insertion loss; linearity CMOS RFIC transmit-receive switch; onchip spiral inductors; size 0.18 mum; synthetic transmission-line; ultra-broadband topology; ultrawideband fully-integrated T-R switch; ultrawideband radar; CMOS process; Communication switching; Linearity; Radar; Radiofrequency integrated circuits; Standards development; Switches; Topology; Transmission lines; Ultra wideband technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radar Symposium, 2008 International
  • Conference_Location
    Wroclaw
  • Print_ISBN
    978-83-7207-757-8
  • Type

    conf

  • DOI
    10.1109/IRS.2008.4585702
  • Filename
    4585702