• DocumentCode
    2370563
  • Title

    SCINDY: logic crosstalk delay fault simulation in sequential circuits

  • Author

    Phadoongsidhi, Marong ; Saluja, Kewal K.

  • Author_Institution
    Dept. of Electr. Eng., King Mongkut´´s Inst. of Technol., Thailand
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    820
  • Lastpage
    823
  • Abstract
    A conventional approach to the simulation of crosstalk-induced delay faults is commonly centered around an electrical-level circuit simulation. While yielding high accuracy, the process is time-consuming and may no longer be feasible for modern, high-density VLSI circuits. To address this issue, we propose and develop a novel approach for gate-level simulation of crosstalk delay faults caused by coupling between aggressor and victim signal lines. Our algorithm extends existing fundamental principles of logic event-driven simulation to crosstalk delay faults excitation, injection, and verification. In addition, the simulator is capable of handling multiple-aggressors/single-victim faults in an efficient manner.
  • Keywords
    VLSI; circuit simulation; crosstalk; fault simulation; logic CAD; logic testing; sequential circuits; SCINDY; aggressor victim signal line coupling; gate level simulation; logic crosstalk delay fault simulation; logic event-driven simulation; sequential circuits; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Coupling circuits; Crosstalk; Delay; Discrete event simulation; Sequential circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2005. 18th International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-2264-5
  • Type

    conf

  • DOI
    10.1109/ICVD.2005.150
  • Filename
    1383378