• DocumentCode
    2370775
  • Title

    Extended Evaluation of Simulated Wavefront Coding Technology in Iris Recognition

  • Author

    Smith, Kelly N. ; Pauca, V. Paul ; Ross, Arun ; Torgersen, Todd ; King, Michael C.

  • Author_Institution
    Intelligence Technol. Innovation Center (ITIC), Washington
  • fYear
    2007
  • fDate
    27-29 Sept. 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The iris is a popular biometric that has been demonstrated to exhibit high matching accuracy and permanence under appropriate conditions. However, there are several limiting factors that are yet to be comprehensively addressed. One major drawback, in standard limited-focus iris recognition systems, is the restrictions imposed by the optical parameters of the acquisition system on the depth of field. Recently, wavefront coding technology has been proposed as a method to extend the depth of field of such limited-focus imaging systems. In this work we examine the utilization of a simulated wavefront coded element for increasing the operational range of iris recognition, without affecting the computational requirements of the system. A statistically relevant dataset of 150 iris images from 50 subjects is employed in a simulation study to determine the matching performance of a standard limited-focus system and a wavefront coded iris imaging system over an extended depth of field. It is shown that the operational range for iris recognition can be significantly increased, without the need to post-process the wavefront coded imagery.
  • Keywords
    biometrics (access control); image coding; image recognition; wavelet transforms; biometric technology; image matching; iris recognition system; wavefront coding technology; Apertures; Biomedical optical imaging; Biometrics; Computational modeling; Humans; Iris recognition; Lenses; Optical distortion; Optical imaging; Optical noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics: Theory, Applications, and Systems, 2007. BTAS 2007. First IEEE International Conference on
  • Conference_Location
    Crystal City, VA
  • Print_ISBN
    978-1-4244-1596-0
  • Electronic_ISBN
    978-1-4244-1597-7
  • Type

    conf

  • DOI
    10.1109/BTAS.2007.4401907
  • Filename
    4401907