Title :
A trustworthiness evaluation framework for distributed networks
Author :
Hall, Sebastian ; McQuay, W. ; Littlejohn, K.
Author_Institution :
Dept. of Mech. Eng., State Univ., Blacksburg, VA, USA
Abstract :
This research examines the utility of Markov switching models in assessing trust and trustworthiness of a heterogeneous network, e.g. distributed sensor networks. As an unsupervised machine learning method, hidden Markov models (HMM) is independent of the assumptions commonly used in modeling trust in complex systems. A relevant time series that switches regimes from trusted to untrusted periods of times is simulated to illustrate the theory of HMM and its effectiveness in Trust modeling. In this paper, we have employed HMM to estimate the parameters of a unified trust model that could make continual determinations of the trustworthiness of the data collected in any application environment. The results indicate that this method could effectively accommodate the desired features of our specified trust model despite various noises and uncertainties in the input signal. This study, by defining a new metric of trustworthiness and using HMM, provides an improvement over past studies in terms of computation costs, accuracy of estimation and forecasting, less a priori assumptions, and system agnosticism.
Keywords :
complex networks; distributed sensors; hidden Markov models; parameter estimation; telecommunication security; time series; trusted computing; unsupervised learning; HMM; Markov switching models; complex systems; data trustworthiness; distributed networks; distributed sensor networks; heterogeneous network trustworthiness; hidden Markov models; parameter estimation; time series; trust modeling; trustworthiness evaluation framework; unified trust model; unsupervised machine learning method; Autoregressive model; Hidden Markov model; Reputation; Trust metric; Trust model; Trustworthiness;
Conference_Titel :
Aerospace and Electronics Conference (NAECON), 2012 IEEE National
Conference_Location :
Dayton, OH
Print_ISBN :
978-1-4673-2791-6
DOI :
10.1109/NAECON.2012.6531028