Title :
Ferroelectric-based functional pass-gate for fine-grain pipelined VLSI computation
Author :
Hanyu, T. ; Kimura, H. ; Kameyama, M. ; Fujimori, Y. ; Nakamura, T. ; Takasu, H.
Author_Institution :
Graduate School of Information Sciences, Tohoku University
Keywords :
CMOS logic circuits; CMOS technology; Ferroelectric films; Ferroelectric materials; Large scale integration; Logic circuits; Nonvolatile memory; Power dissipation; Random access memory; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992195
