• DocumentCode
    237090
  • Title

    NEXT and FEXT characteristics and suppressions in dense 25Gbps+ backplane vias

  • Author

    Amleshi, Peerouz ; Cong Gao

  • Author_Institution
    Molex Inc., Lisle, IL, USA
  • fYear
    2014
  • fDate
    4-8 Aug. 2014
  • Firstpage
    979
  • Lastpage
    985
  • Abstract
    At 25Gbps and beyond, crosstalk noise can degrade a backplane channel signal quality significantly. High density interconnects can generate high crosstalk noise due to the close proximities of the components. In particular, interfacing dense chips and connectors with PCB requires dense implementation of signal via structures. Placing ground via guards can reduce the field overlap between signal via structures but this would also reduce density and create impedance discontinuities; therefore, these guarding via structures need to be placed strategically to reduce their adverse effects. In this study we analyze how near and far end crosstalk (NEXT and FEXT) within the signal via fields are affected by anti-pad, ground via, and ground plane layers. It will be shown that FEXT and NEXT can be affected differently in the presence of ground plane anti-pads. Relationships between these parameters with respect to ground anti-pads and the effectiveness of guarding via structures in reducing crosstalk will be presented.
  • Keywords
    crosstalk; electric connectors; electric impedance; interference suppression; printed circuits; FEXT characteristics; NEXT characteristics; PCB; backplane channel signal quality; bit rate 25 Gbit/s; connectors; crosstalk noise reduction; dense chips; ground plane antipads; ground plane layers; high density interconnects; impedance discontinuities; Abstracts; Backplanes; Connectors; Copper; Crosstalk; Integrated circuit modeling; Laminates; FEXT; High Speed; NEXT; Via;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
  • Conference_Location
    Raleigh, NC
  • Print_ISBN
    978-1-4799-5544-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2014.6899110
  • Filename
    6899110