Title :
A Carrier-Ethernet oriented transport protocol with a novel congestion control and QoS integration: Analytical, simulated and experimental validation
Author :
Estevez, Claudio ; Angulo, Sergio ; Abujatum, Andrés ; Ellinas, Georgios ; Liu, Cheng ; Chang, Gee-Kung
Author_Institution :
Dept. of Electr. Eng., Univ. of Chile, Santiago, Chile
Abstract :
Carrier Ethernet is becoming the dominating backhaul network due to its flexibility, scalability, interoperability and low-cost. Carrier Ethernet networks (CENs) are inherently high bandwidth-delay product (BDP) networks, hence Traditional TCP, and similar variants, make undesirable choices of transport protocol mainly because of the aggressive multiplicative-decrease algorithm. The Ethernet-Services Transport Protocol (ESTP) has proven relieve the effects of the decrease algorithm by dynamically adjusting the transmission rate according to the level of congestion estimated in the network. It should be emphasized that most protocols detect congestion, but do not estimate the level of congestion. Also ESTP incorporates QoS information to further improve performance. In this work, a steady-state throughput analytical model of ESTP is derived, an experimental testbed is built and simulation results are obtained. All validation methods show good agreement.
Keywords :
local area networks; quality of service; telecommunication congestion control; transport protocols; BDP networks; CEN; ESTP; Ethernet-service transport protocol; QoS information; QoS integration; aggressive multiplicative-decrease algorithm; backhaul network; bandwidth-delay product networks; carrier Ethernet networks; carrier-Ethernet oriented transport protocol; congestion control; steady-state throughput analytical model; transmission rate; Analytical models; Channel models; Protocols; Steady-state; Throughput; Carrier Ethernet; ESTP; Ethernet; MEN; QoS; TCP; congestioncontrol; throughput model; transport control;
Conference_Titel :
Communications (ICC), 2012 IEEE International Conference on
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4577-2052-9
Electronic_ISBN :
1550-3607
DOI :
10.1109/ICC.2012.6364060