Title :
Characteristics of a fuzzy test system
Author_Institution :
Tokushima Bunri Univ, Japan
Abstract :
Stable outgoing quality is assured by using a test system with a fuzzy controller, even when sudden changes of incoming quality occur. Non test is automatically selected, when incoming quality becomes far better than a target quality. The author studies how to check the stability condition of the fuzzy test system. The condition is that the value, the sample size at the t-th test divided by the size of lot products, is smaller than that, the outgoing quality at (t-1)-th test by incoming quality
Keywords :
fuzzy control; production testing; quality control; semiconductor device testing; fuzzy controller; fuzzy test system; incoming quality; sample size; semiconductor device testing; stability condition; target quality; Automatic testing; Condition monitoring; Control systems; Fuzzy control; Fuzzy systems; Manufacturing processes; Semiconductor device testing; Semiconductor devices; System testing; Throughput;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367202
