A built-in self-test approach for medium to high-resolution digital-to-analog converters

Author

Arabi, Karim ; Kaminska, Bozena ; Rzeszut, Janusz

Author_Institution

Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

fYear

1994

fDate

15-17 Nov 1994

Firstpage

373

Lastpage

378

Abstract

A test approach and circuitry suitable for built-in self-test (BIST) of medium to high-resolution digital-to-analog (D/A) converter are described. Offset, gain, linearity and differential linearity errors are tested without using mixed-mode or logic test equipment. The proposed BIST structure presents a compromise between test cost, area overhead and test time. The BIST circuitry has been designed using CMOS 1.2 μm technology. The simulations performed show that the BIST is applicable for testing D/A converters up to 16-bits resolution. By a minor modification the test structure would be able to localize the fail situation and to test all D/A converters on the chip

Keywords

CMOS integrated circuits; automatic testing; built-in self test; design for testability; digital-analogue conversion; integrated circuit testing; logic testing; BIST; BIST circuitry; BIST structure; CMOS; D/A converters; area overhead; autozeroing; built-in self-test; differential linearity errors; digital-to-analog converters; gain; high-resolution digital-to-analog converter; linearity; logic test equipment; minor modification; mixed-mode; simulations; test cost; test structure; test time; Analog circuits; Analog-digital conversion; Built-in self-test; CMOS technology; Circuit testing; Digital-analog conversion; Integrated circuit testing; Linearity; Logic testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1994., Proceedings of the Third Asian

Conference_Location

Nara

Print_ISBN

0-8186-6690-0

Type

conf

DOI

10.1109/ATS.1994.367203

Filename

367203