DocumentCode
2371078
Title
Diffusion maps for exploring electro-optical synthetic vehicle image data
Author
Ramirez, J. ; Mendoza-Schrock, O.
Author_Institution
Dept. of Electr., Univ. of Colorado, Boulder, CO, USA
fYear
2012
fDate
25-27 July 2012
Firstpage
126
Lastpage
133
Abstract
In this work, we explore low-dimensional representations of high-dimensional data derived from electro-optical synthetic vehicle images. The collection of vehicle images consists of four different vehicle models: Toyota Camry, Toyota Avalon, Toyota Tacoma, and Nissan Sentra. This data contains 3,601 160 × 213 gray-scale vehicle images sampled uniformly over a camera view hemisphere. We use the non-linear manifold learning technique of diffusion maps with Gaussian kernel to explore low-dimensional structure the high-dimensional cloud of vehicle image observations. Diffusion maps have been shown to be a valuable tool in the analysis of high-dimensional data and the technique is able to extract an approximation for the underlying structure inherent to the data. Our analysis includes examining how the diffusion time and kernel width leads to different low-dimensional representations and we present a novel technique to relate the kernel width to the distribution of data in the observation space. In addition, we present initial results for multi-class vehicle classification through low-dimensional embedding coordinates and the out-of-sample extension of unlabeled vehicle images.
Keywords
image classification; image representation; learning (artificial intelligence); Gaussian kernel; Nissan Sentra; Toyota Avalon; Toyota Camry; Toyota Tacoma; camera view hemisphere; diffusion kernel; diffusion map; diffusion time; electro-optical synthetic vehicle image data; gray-scale vehicle image; high-dimensional data representation; low-dimensional representation; multiclass vehicle classification; nonlinear manifold learning technique; vehicle image observation;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference (NAECON), 2012 IEEE National
Conference_Location
Dayton, OH
ISSN
0547-3578
Print_ISBN
978-1-4673-2791-6
Type
conf
DOI
10.1109/NAECON.2012.6531042
Filename
6531042
Link To Document