Fault diagnosis technique for subranging ADCs

Author

Charoenrook, A. ; Soma, Mani

Author_Institution

Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

fYear

1994

fDate

15-17 Nov 1994

Firstpage

367

Lastpage

372

Abstract

This paper describes a fault diagnosis technique for subranging analog to digital converters (ADCs). Functional fault in each of the analog component in the subranging ADC affects the transfer function differently. This property is employed for fault diagnosis. Deviation from ideal of the transfer function which is categorized into offset error, gain error, DNL, and INL data, are used for fault diagnosis. The technique is therefore not dependent on the test method, and it can be applied to dynamic test data. The diagnosis procedure is presented in detail. Simulation results and a case study are also presented. They verify the diagnosis technique

Keywords

analogue-digital conversion; digital simulation; fault diagnosis; fault location; DNL; INL; differential nonlinearity error; dynamic test data; fault diagnosis; fault models; functional fault; gain error; integral nonlinearity error; offset error; subranging ADC; transfer function; Analog-digital conversion; Circuit faults; Circuit testing; Fault diagnosis; Linearity; Resistors; Signal resolution; Switches; Transfer functions; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1994., Proceedings of the Third Asian

Conference_Location

Nara

Print_ISBN

0-8186-6690-0

Type

conf

DOI

10.1109/ATS.1994.367204

Filename

367204