• DocumentCode
    2371091
  • Title

    Phase Conjugate Interferometry For Thin Film Analysis

  • Author

    Parshall, E.R. ; Cronin-Colomb, M.

  • Author_Institution
    Tufts University
  • fYear
    1990
  • fDate
    16-20 July 1990
  • Firstpage
    281
  • Lastpage
    282
  • Keywords
    Detectors; Ellipsometry; Mirrors; Optical interferometry; Optimized production technology; Phase detection; Phase measurement; Reflectivity; Thin film devices; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nonlinear Optics: Materials, Phenomena and Devices, 1990. Digest. NLO '90.
  • Conference_Location
    Kauai, HI, USA
  • Type

    conf

  • DOI
    10.1109/NLO.1990.695955
  • Filename
    695955
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2371091