DocumentCode
2371267
Title
Data path synthesis for easy testability
Author
Dhodhi, Muhanunad K. ; Ahmad, Imtiaz ; Ismaeel, Asad A.
Author_Institution
Dept. of Electr. & Comput. Eng., Kuwait Univ., Safat, Kuwait
fYear
1994
fDate
15-17 Nov 1994
Firstpage
317
Lastpage
322
Abstract
Synthesizing digital circuits which can be easily tested is an important and necessary aspect of a useful behavioral synthesis system. Testability at behavioral level can be enhanced by minimizing the number of self-adjacent registers (self-loops). This paper describes a technique for synthesizing an easy testable (loop-free) data path structure from a behavioral description of a design. The synthesis process uses an approach based on a problem-space genetic algorithm (PSGA) to perform concurrent scheduling and allocation of testable functional units to eliminate the self-loops. Experiments on benchmarks show that the self-loops can be eliminated with a minimum additional hardware resources to result in a testable data path
Keywords
concurrent engineering; design for testability; genetic algorithms; logic design; logic testing; resource allocation; scheduling; shift registers; benchmarks; data path structure; data path synthesis; problem-space genetic algorithm; scheduling; self-adjacent registers; self-loops; synthesis process; testability; testable data path; testable functional units; Automatic testing; Benchmark testing; Circuit synthesis; Circuit testing; Digital circuits; Genetic algorithms; Hardware; Performance evaluation; Registers; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location
Nara
Print_ISBN
0-8186-6690-0
Type
conf
DOI
10.1109/ATS.1994.367212
Filename
367212
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