• DocumentCode
    2371267
  • Title

    Data path synthesis for easy testability

  • Author

    Dhodhi, Muhanunad K. ; Ahmad, Imtiaz ; Ismaeel, Asad A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Kuwait Univ., Safat, Kuwait
  • fYear
    1994
  • fDate
    15-17 Nov 1994
  • Firstpage
    317
  • Lastpage
    322
  • Abstract
    Synthesizing digital circuits which can be easily tested is an important and necessary aspect of a useful behavioral synthesis system. Testability at behavioral level can be enhanced by minimizing the number of self-adjacent registers (self-loops). This paper describes a technique for synthesizing an easy testable (loop-free) data path structure from a behavioral description of a design. The synthesis process uses an approach based on a problem-space genetic algorithm (PSGA) to perform concurrent scheduling and allocation of testable functional units to eliminate the self-loops. Experiments on benchmarks show that the self-loops can be eliminated with a minimum additional hardware resources to result in a testable data path
  • Keywords
    concurrent engineering; design for testability; genetic algorithms; logic design; logic testing; resource allocation; scheduling; shift registers; benchmarks; data path structure; data path synthesis; problem-space genetic algorithm; scheduling; self-adjacent registers; self-loops; synthesis process; testability; testable data path; testable functional units; Automatic testing; Benchmark testing; Circuit synthesis; Circuit testing; Digital circuits; Genetic algorithms; Hardware; Performance evaluation; Registers; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1994., Proceedings of the Third Asian
  • Conference_Location
    Nara
  • Print_ISBN
    0-8186-6690-0
  • Type

    conf

  • DOI
    10.1109/ATS.1994.367212
  • Filename
    367212