Title :
Estimation of Cold Characteristics for Fundamental-Mode MBK Cavities
Author :
Nguyen, Khanh T. ; Abe, David K. ; Pershing, Dean E. ; Levush, Baruch
Author_Institution :
Beam-Wave Res. Inc., Bethesda, MD
Abstract :
We describe the development of simple formulae to accurately estimate the R/Q´s in single-gap, fundamental-mode MBK cavities and to describe their sensitivity to radius and frequency. These equations can be very useful in the initial design process and can lead to robust cavity designs that are relatively insensitive to manufacturing tolerances
Keywords :
cavity resonators; klystrons; beam-wave interaction; multiple beam klystrons; robust cavity designs; single-gap cavity; Computational modeling; Equations; Geometry; Klystrons; Laboratories; Manufacturing processes; Nose; Process design; Radio frequency; Robustness; MBK; Multiple-beam klystron; R/Q; single-gap cavity;
Conference_Titel :
Vacuum Electronics Conference, 2006 held Jointly with 2006 IEEE International Vacuum Electron Sources., IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0108-9
DOI :
10.1109/IVELEC.2006.1666266
