Title :
Automatic test generation for functional verification of microprocessors
Author :
Miyake, Jiro ; Brown, Gary ; Ueda, Masahiko ; Nishiyama, Tamotsu
Author_Institution :
Semicond. Res. Center, Matsushita Electr. Ind. Co. Ltd., Japan
Abstract :
A novel method to generate test programs for functional verification of microprocessors is presented. The method combines schemes of random generation and specific sequence generation. Four levels of hierarchical information are used to generate efficient test programs including many complicated sequences. Considerations in the test generation is also discussed
Keywords :
application generators; automatic test software; automatic testing; computer testing; integrated circuit testing; microprocessor chips; VLSI; automatic test generation; functional verification; hierarchical information; microprocessors; random generation; specific sequence generation; Algorithm design and analysis; Automatic testing; Decoding; Frequency; Hardware design languages; Microprocessors; Pipelines; Registers; System testing; Very large scale integration;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367216
