DocumentCode
2371323
Title
Automatic test generation for functional verification of microprocessors
Author
Miyake, Jiro ; Brown, Gary ; Ueda, Masahiko ; Nishiyama, Tamotsu
Author_Institution
Semicond. Res. Center, Matsushita Electr. Ind. Co. Ltd., Japan
fYear
1994
fDate
15-17 Nov 1994
Firstpage
292
Lastpage
297
Abstract
A novel method to generate test programs for functional verification of microprocessors is presented. The method combines schemes of random generation and specific sequence generation. Four levels of hierarchical information are used to generate efficient test programs including many complicated sequences. Considerations in the test generation is also discussed
Keywords
application generators; automatic test software; automatic testing; computer testing; integrated circuit testing; microprocessor chips; VLSI; automatic test generation; functional verification; hierarchical information; microprocessors; random generation; specific sequence generation; Algorithm design and analysis; Automatic testing; Decoding; Frequency; Hardware design languages; Microprocessors; Pipelines; Registers; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location
Nara
Print_ISBN
0-8186-6690-0
Type
conf
DOI
10.1109/ATS.1994.367216
Filename
367216
Link To Document