Design of pseudo-random patterns with low linear dependence and equi-distribution

Author

Matsufuji, Shinya ; Tadaki, Shin-ichi ; Yamanaka, Teruki

Author_Institution

Dept. of Inf. Sci., Saga Univ., Japan

fYear

1994

fDate

15-17 Nov 1994

Firstpage

274

Lastpage

279

Abstract

Pseudo-random patterns with equi-distribution given by some phase-shifted M-sequences are often used to produce random numbers used in simulations and test patterns in VLSI tests. Low linear dependency is one of the desirable and important properties of random patterns as well as equi-distribution. This paper discusses pseudo-random patterns with equi-distribution and low linear dependence

Keywords

VLSI; correlation methods; integrated logic circuits; logic design; logic testing; random processes; VLSI tests; bit pattern correlation; equi-distribution; linear dependence; low linear dependency; phase-shifted M-sequences; pseudo-random patterns; Automata; Ear; Hybrid power systems; Information science; Physics; Polynomials; Shift registers; Testing; Transportation; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1994., Proceedings of the Third Asian

Conference_Location

Nara

Print_ISBN

0-8186-6690-0

Type

conf

DOI

10.1109/ATS.1994.367219

Filename

367219

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2371361