• DocumentCode
    2371445
  • Title

    Test-driven development as a defect-reduction practice

  • Author

    Williams, Laurie ; Maximilien, E. Michael ; Vouk, Mladen

  • Author_Institution
    Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2003
  • fDate
    17-20 Nov. 2003
  • Firstpage
    34
  • Lastpage
    45
  • Abstract
    Test-driven development is a software development practice that has been used sporadically for decades. With this practice, test cases (preferably automated) are incrementally written before production code is implemented. Test-driven development has recently re-emerged as a critical enabling practice of the extreme programming software development methodology. We ran a case study of this practice at IBM. In the process, a thorough suite of automated test cases was produced after UML design. In this case study, we found that the code developed using a test-driven development practice showed, during functional verification and regression tests, approximately 40% fewer defects than a baseline prior product developed in a more traditional fashion. The productivity of the team was not impacted by the additional focus on producing automated test cases. This test suite aids in future enhancements and maintenance of this code. The case study and the results are discussed in detail.
  • Keywords
    Unified Modeling Language; formal verification; program testing; regression analysis; IBM; UML design; automated test cases; defect-reduction practice; extreme programming software development; functional verification; production code; regression test; software development practice; test-driven development; Automatic testing; Computer science; NASA; Production; Productivity; Programming; Radio access networks; Software testing; Unified modeling language; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 2003. ISSRE 2003. 14th International Symposium on
  • ISSN
    1071-9458
  • Print_ISBN
    0-7695-2007-3
  • Type

    conf

  • DOI
    10.1109/ISSRE.2003.1251029
  • Filename
    1251029