Title :
A Novel Technique for Determining Kernels of Volterra Based Behavioral Models for RF Amplifiers
Author :
Zorn, Stefan ; Ehm, Henning J. ; Weigel, Robert
Author_Institution :
Inst. for Electron. Eng., Friedrich-Alexander Univ. of Erlangen-Nuremberg, Erlangen
Abstract :
This paper presents a new technique to determine the kernels of Volterra series based behavioral models of RF amplifiers in the frequency domain. A model with three kernels and a memory length of one is developed. The kernels of this model are assigned only by using a two-tone test. No knowledge of the integrated circuit is needed to determine all model parameters. The derivation of such a model out of well known mathematical basics is shown such as the used measurement setup. Measured data and simulation deliverables are being compared and show a good match. A comparison between a Saleh model and the new modeling approach concludes this paper.
Keywords :
Volterra series; integrated circuit modelling; radiofrequency amplifiers; RF amplifiers; Saleh model; Volterra series; behavioral models; integrated circuit; Consumer electronics; Equations; Frequency; Helium; Integrated circuit measurements; Integrated circuit modeling; Kernel; Power system modeling; Radiofrequency amplifiers; Voltage;
Conference_Titel :
Microwave Conference, 2008. EuMC 2008. 38th European
Conference_Location :
Amsterdam
Print_ISBN :
978-2-87487-006-4
DOI :
10.1109/EUMC.2008.4751434