DocumentCode
2371592
Title
Detectability of spurious signals with limited propagation in combinational circuits
Author
Moll, Francesc ; Roca, Miquel ; Marche, David ; Rubio, Antonio
Author_Institution
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
fYear
1994
fDate
15-17 Nov 1994
Firstpage
176
Lastpage
181
Abstract
The continuous reduction in scale achieved in microelectronic technology and the increasing switching speed may cause parasitic or spurious signals to appear, due to crosstalk. In this work, scale reduction of interconnections is analyzed, showing the increasing mutual capacitance and a model of crosstalk considering parasitic capacitive coupling is shown. A method for studying the propagation limits of crosstalk signals has been developed for combinational circuits. An algorithm for crosstalk faults test pattern generation is proposed taking into account the propagation limitation of the signals. Results of the implementation of the algorithm are shown, putting into evidence the dependency of the detectability of spurious signals on their propagation limits
Keywords
VLSI; combinational circuits; crosstalk; digital simulation; fault diagnosis; fault location; integrated circuit noise; logic testing; RAPHAEL; combinational circuits; crosstalk; detectability; interconnections; limited propagation; microelectronic technology; mutual capacitance; parasitic capacitive coupling; propagation limits; reduction in scale; scale reduction; spurious signals; switching speed; test pattern generation; Circuit faults; Combinational circuits; Coupling circuits; Crosstalk; Integrated circuit interconnections; Microelectronics; Mutual coupling; Parasitic capacitance; Signal detection; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location
Nara
Print_ISBN
0-8186-6690-0
Type
conf
DOI
10.1109/ATS.1994.367232
Filename
367232
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