Testing of analog integrated circuits based on power-supply current monitoring and discrimination analysis

Author

Wang, ZhiHua ; Gielen, Georges ; Sansen, Willy

Author_Institution

Dept. of Electr. Eng., Katholieke Univ., Leuven, Belgium

fYear

1994

fDate

15-17 Nov 1994

Firstpage

126

Lastpage

131

Abstract

A new method for the testing and fault detection of analog integrated circuits is presented. The power-supply current is monitored to detect possible faults in an analog circuit. The spectrum of the power-supply current is used to construct the statistical signature of the fault-free and faulty circuits. The decision of a circuit being fault-free or faulty is taken based on the Bayes decision rule fully taking into account the tolerances on the circuit parameters. Examples are given to show the efficiency and effectiveness of the algorithm

Keywords

Bayes methods; CMOS analogue integrated circuits; active filters; analogue integrated circuits; band-pass filters; bipolar integrated circuits; electric current measurement; fault diagnosis; integrated circuit testing; operational amplifiers; Bayes decision rule; CMOS operational amplifier; active bandpass filter; algorithm effectiveness; algorithm efficiency; analog integrated circuits; bipolar differential circuit; discrimination analysis; fault detection; fault-free circuits; faulty circuits; power-supply current monitoring; statistical signature; tolerances; Analog circuits; Analog integrated circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Monitoring; Packaging; Probes;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1994., Proceedings of the Third Asian

Conference_Location

Nara

Print_ISBN

0-8186-6690-0

Type

conf

DOI

10.1109/ATS.1994.367242

Filename

367242