DocumentCode
2371819
Title
The Determination of Tape Helix Cold Test Parameters Using Fourier and Convolution Techniques
Author
Cun, Vinh
Author_Institution
Commun. & Power Industries, Palo Alto, CA
fYear
0
fDate
0-0 0
Firstpage
287
Lastpage
288
Abstract
A program was written to predict cold test parameters of helix traveling wave tubes. Parameters such as dispersion, interaction impedance, and phase velocity can be obtained in that the flexibility of the program allows for quick simulations compared to commercial CAD packages
Keywords
Fourier transforms; circuit simulation; convolution; travelling wave tubes; CAD packages; cold test parameters; convolution technique; dispersion parameter; helix traveling wave tubes; interaction impedance; phase velocity; tape helix; Computational modeling; Convolution; Impedance; Mathematics; Packaging; Power industry; Predictive models; Space exploration; Structural rods; Testing; cold test; dispersion; interaction impedance; tape helix; traveling wave tube;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, 2006 held Jointly with 2006 IEEE International Vacuum Electron Sources., IEEE International
Conference_Location
Monterey, CA
Print_ISBN
1-4244-0108-9
Type
conf
DOI
10.1109/IVELEC.2006.1666297
Filename
1666297
Link To Document