• DocumentCode
    2371883
  • Title

    Comparative Study of Microwave Power Modules (MPM) and Complex Microwave Devices (CMD) Parameters and their Preferable Application Areas

  • Author

    Kotov, A.S. ; Gelvich, E.A. ; Zakurdayev, A.D.

  • Author_Institution
    FSUE RPC
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    297
  • Lastpage
    299
  • Abstract
    To resolve the competing desires for increased functionality and reduced system size and weight of REE, there were suggested and developed complex microwave devices (CMD) in Russia as stated in E. A. Gelvich (1982), and microwave power modules (MPM) in USA as stated in R. K. Parker et al. (1992). Both of them are microwave units that are designed on the principles of integrated low power circuits, and provide the potential to amplify complex signals to the required level. Both of them are constructively- and functionally-integrated devices in which all elements comprising the MPM and CMD are carefully matched to ensure that each constituent element of the device (CMD or MPM) operates in its optimal regime. On the base of the accomplished analysis there can be made a conclusion that both devices, MPM and CMD, have a good perspective for on-board applications: the MPM - in systems where the broad amplification frequency band is the prevailing parameter, the CMD - in systems where high power, many functions, and high signal quality are of critical importance. A more detailed analysis of the MPM and CMD parameters are given in the report
  • Keywords
    low-power electronics; microwave power amplifiers; network analysis; broad amplification frequency; complex microwave devices; high signal quality; integrated low power circuits; microwave power modules; microwave units; Control systems; Frequency; Microwave devices; Multichip modules; Phase locked loops; Power amplifiers; Power generation; Radio control; Signal design; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2006 held Jointly with 2006 IEEE International Vacuum Electron Sources., IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    1-4244-0108-9
  • Type

    conf

  • DOI
    10.1109/IVELEC.2006.1666302
  • Filename
    1666302