Test scheduling using test subsession partitioning

Author

Xiang, Dong

Author_Institution

Inst. of Comput. Technol., Acad. Sinica, Beijing, China

fYear

1994

fDate

15-17 Nov 1994

Firstpage

63

Lastpage

68

Abstract

The tester time is expensive, which should be reduced as much as possible. Considering the fact that test response observation and test application only use a fraction of the whole testing time, a test subsession partitioning scheme is offered. Therefore, some further sources of the test scheduling problem are used. Subcircuits in conflict according to the definition are only partially in conflict now. A new test scheduling algorithm is given after the test subsession partitioning scheme is combined. This algorithm has learning ability by recording the previous conflict information, which prunes the searching space of the test scheduling problem effectively

Keywords

automatic testing; design for testability; graph colouring; learning (artificial intelligence); parallel algorithms; scheduling; conflict information; learning ability; parallel testing graph; polynomial time solvable problem; searching space; test response observation; test scheduling algorithm; test subsession partitioning; vertex coloring; Automatic testing; Circuit testing; Computers; Laboratories; Partitioning algorithms; Polynomials; Processor scheduling; Scheduling algorithm; Sequential analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1994., Proceedings of the Third Asian

Conference_Location

Nara

Print_ISBN

0-8186-6690-0

Type

conf

DOI

10.1109/ATS.1994.367252

Filename

367252