Title :
Test scheduling using test subsession partitioning
Author_Institution :
Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Abstract :
The tester time is expensive, which should be reduced as much as possible. Considering the fact that test response observation and test application only use a fraction of the whole testing time, a test subsession partitioning scheme is offered. Therefore, some further sources of the test scheduling problem are used. Subcircuits in conflict according to the definition are only partially in conflict now. A new test scheduling algorithm is given after the test subsession partitioning scheme is combined. This algorithm has learning ability by recording the previous conflict information, which prunes the searching space of the test scheduling problem effectively
Keywords :
automatic testing; design for testability; graph colouring; learning (artificial intelligence); parallel algorithms; scheduling; conflict information; learning ability; parallel testing graph; polynomial time solvable problem; searching space; test response observation; test scheduling algorithm; test subsession partitioning; vertex coloring; Automatic testing; Circuit testing; Computers; Laboratories; Partitioning algorithms; Polynomials; Processor scheduling; Scheduling algorithm; Sequential analysis;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367252
